High-precision atomic-scale strain mapping of nanoparticles from STEM images

Summary

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Authors: Xiaonan Luo, Aakash Varambhia, Weixin Song, Dogan Ozkaya, Sergio Lozano-Perez, Peter D. Nellist

Journal title: Ultramicroscopy

Journal publisher: Pergamon Press Ltd.

Published year: 2022

Published pages: 113561

DOI identifier: 10.1016/j.ultramic.2022.113561

ISSN: 0346-251X