Atomic-scale imaging of flexoelectric polarization around engineered crack tips

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Authors: Hongguang Wang, Hans Boschker, Xijie Jiang, Yi Wang, Robert Stark, Jochen Mannhart and Peter A. van Aken

Journal title: Microscopy and Microanalysis

Journal publisher: Cambridge University Press

Published year: 2021

DOI identifier: 10.1017/s1431927621008394

ISSN: 1431-9276