Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling

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Authors: Etienne Monier, Thomas Oberlin, Nathalie Brun, Xiaoyan Li, Marcel Tencé, Nicolas Dobigeon

Journal title: Ultramicroscopy

Journal number: 215

Journal publisher: Elsevier BV

Published year: 2020

Published pages: 112993

DOI identifier: 10.1016/j.ultramic.2020.112993

ISSN: 0304-3991