Interface degradation and field screening mechanism behind bipolar-cycling fatigue in ferroelectric capacitors

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Authors: Minh Thanh Do; Minh Thanh Do; Nicolas Gauquelin; Minh D. Nguyen; F. Blom; Jo Verbeeck; Gertjan Koster; E. P. Houwman; Guus Rijnders

Journal title: APL materials

Journal number: 16

Journal publisher: AIP Publishing

Published year: 2021

DOI identifier: 10.1063/5.0038719

ISSN: 2166-532X