Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network

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Authors: Bertoni, G.; Rotunno, E.; Marsmans, D.; Tiemeijer P.; Tavabi, A.H.; Dunin-Borkowski, R.E.; Grillo, V.

Journal title: Ultramicroscopy

Journal publisher: Pergamon Press Ltd.

Published year: 2023

Published pages: 113663

DOI identifier: 10.1016/j.ultramic.2022.113663

ISSN: 0346-251X