Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Annelies De wael, Annick De Backer, Ivan Lobato, Sandra Van Aert

Journal title: Ultramicroscopy

Journal publisher: Elsevier BV

Published year: 2021

DOI identifier: 10.1016/j.ultramic.2021.113391

ISSN: 0304-3991