Correlation between sputter deposition parameters and I-V characteristics in double-barrier memristive devices

Summary

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Authors: Finn Zahari, Felix Schlichting, Julian Strobel, Sven Dirkmann, Julia Cipo, Sven Gauter, Jan Trieschmann, Richard Marquardt, Georg Haberfehlner, Gerald Kothleitner, Lorenz Kienle, Thomas Mussenbrock, Martin Ziegler, Holger Kersten, Hermann Kohlstedt

Journal title: Journal of Vacuum Science & Technology B

Journal number: 37/6

Journal publisher: AVS Science and Technology Society

Published year: 2019

Published pages: 061203

DOI identifier: 10.1116/1.5119984

ISSN: 2166-2754