A New Approach for 3D Quantitative STEM Using Defocus Corrected Electron Ptychography

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Authors: Ali Mostaed, Emanuela Liberti, Chen Huang, Angus I. Kirkland and Peter Nellist

Journal title: Microscopy and Microanalysis

Journal publisher: CAMBRIDGE UNVIERSITY PRESS

Published year: 2022

Published pages: 380–381

DOI identifier: 10.1017/s1431927622002252

ISSN: 1435-8115