Atom column detection from simultaneously acquired ABF and ADF STEM images

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Authors: J. Fatermans, A.J. den Dekker, K. Müller-Caspary, N. Gauquelin, J. Verbeeck, S. Van Aert

Journal title: Ultramicroscopy

Journal publisher: Elsevier BV

Published year: 2020

Published pages: 113046

DOI identifier: 10.1016/j.ultramic.2020.113046

ISSN: 0304-3991