Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors

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Authors: Senturk, DG; De Backer, A; Friedrich, T; Van Aert, S

Journal title: ULTRAMICROSCOPY

Journal publisher: Pergamon Press Ltd.

Published year: 2022

Published pages: 113517

DOI identifier: 10.1016/j.ultramic.2022.113626

ISSN: 0346-251X