In-Situ Electrical Biasing of Electrically Connected TEM Lamellae with Embedded Nanodevices

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Authors: Maria Brodovoi; Kilian Gruel; Lucas Chapuis; Aurélien Masseboeuf; Cécile Marcelot; Martin Hÿtch; Frédéric Lorut; Christophe Gatel

Journal publisher: ASM Digital Library

Published year: 2021

DOI identifier: 10.31399/asm.cp.istfa2021p0190