Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions

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Authors: Zhang, Z.; Lobato, I.; De Backer, A.; Van Aert, S.; Nellist, P.

Journal title: Ultramicroscopy

Journal publisher: Pergamon Press Ltd.

Published year: 2023

Published pages: 246

DOI identifier: 10.1016/j.ultramic.2022.113671

ISSN: 0346-251X