Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings

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Authors: A.Velazco, A.Béché, D.Jannis, J.Verbeeck

Journal title: Ultramicroscopy

Journal publisher: Elsevier BV

Published year: 2021

DOI identifier: 10.1016/j.ultramic.2021.113398

ISSN: 0304-3991