Benefits of direct electron detection and PCA for EELS investigation of organic photovoltaics materials

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Authors: Georg Haberfehlner; Sebastian F. Hoefler; Thomas Rath; Gregor Trimmel; Gerald Kothleitner; Ferdinand Hofer

Journal title: Micron

Journal number: 44

Journal publisher: Pergamon Press Ltd.

Published year: 2020

DOI identifier: 10.1016/j.micron.2020.102981

ISSN: 0968-4328