Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM

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Authors: De Wael, A; De Backer, A; Yu, CP; Senturk, DG; Lobato, I; Faes, C; Van Aert, S

Journal title: MICROSCOPY AND MICROANALYSIS

Journal publisher: CAMBRIDGE UNIV PRESS

Published year: 2022

Published pages: 374–383

DOI identifier: 10.1017/s1431927622012284

ISSN: 1435-8115