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Authors: Luigi Raiano, Joshua Di Tocco, Carlo Massaroni, Giovanni Di Pino, Emiliano Schena, Domenico Formica
Journal title: 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT
Journal publisher: IEEE
Published year: 2020
Published pages: 734-739
DOI identifier: 10.1109/metroind4.0iot48571.2020.9138265
ISBN: 978-1-7281-4892-2