Summary
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Authors: João Alfredo Santos, Francisco Pedro, Mário Coimbra, Andrés Figuero, Conceição Juana E.M. Fortes, José Sande, Moritz Körner, Rute Lemos, Antje Bornschein, Julius Weimper, Jeroen van den Bos, Bastian Dost, Bas Hofland, Rita F. Carvalho, Alberto Alvarellos, Enrique Peña, Reinhard Pohl, Nils B. Kerpen, Maria Teresa Reis
Journal title: Defect and Diffusion Forum
Journal number: 396
Journal publisher: Trans Tech Publications Ltd
Published year: 2019
Published pages: 32-41
DOI identifier: 10.4028/www.scientific.net/ddf.396.32
ISSN: 1662-9507