HRS Instability in Oxide-Based Bipolar Resistive Switching Cells

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Authors: Stefan Wiefels, Christopher Bengel, Nils Kopperberg, Kaihua Zhang, Rainer Waser, Stephan Menzel

Journal title: IEEE Transactions on Electron Devices

Journal number: 67/10

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2020

Published pages: 4208-4215

DOI identifier: 10.1109/ted.2020.3018096

ISSN: 0018-9383