Clustering for Different Scales of Measurement - The Gap Ratio Weighted K-Means Algorithm

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Authors: J. Guérin, O. Gibaru, S. Thiery, & E. Nyiri

Journal title: Computer Science & Information Technology (CS & IT) Proceedings of the 7th International Conference on Computer Science, Engineering and Information Technology (CCSEIT 2017)

Journal number: 68

Journal publisher: AIRCC Publishing Corporation

Published year: 2017

Published pages: 35-52

ISBN: 978-1-921987-66-3