DeepRes : a new deep-learning- and aspect-based local resolution method for electron-microscopy maps

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Authors: Erney Ramírez-Aportela, Javier Mota, Pablo Conesa, Jose Maria Carazo, Carlos Oscar S. Sorzano

Journal title: IUCrJ

Journal number: 6/6

Journal publisher: -

Published year: 2019

DOI identifier: 10.1107/s2052252519011692

ISSN: 2052-2525