Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip

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Authors: Douglas A. Santos; André M. P. Mattos; Lucas M. Luza; Carlo Cazzaniga; Maria Kastriotou; Douglas R. Melo; Luigi Dilillo

Journal title: IEEE Xplore

Journal number: 8

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.1109/DFT56152.2022.9962335

ISSN: 2765-933X