Single Event Upsets under Proton, Thermal and Fast Neutron Irradiation in Emerging Nonvolatile Memories

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Authors: Golnaz Korkian, Daniel León, Francisco J. Franco, Juan C. Fabero, Manon Letiche, Yolanda Morilla, Pedro Martín-Holgado, Helmut Puchner, Hortensia Mecha, Juan A. Clemente

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.1109/access.2022.3217527