Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices

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Authors: Lucas Matana Luza; Frederic Wrobel; Luis Entrena; Luigi Dilillo

Journal title: IEEE Xplore

Journal number: 20

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.1109/ETS54262.2022.9810454

ISBN: 978-1-6654-6706-3