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Authors: Fabian Thome, Erdin Ture, Arnulf Leuther, Frank Schafer, Alessandro Navarrini, Patrice Serres, Oliver Ambacher
Journal title: 2020 IEEE/MTT-S International Microwave Symposium (IMS)
Journal publisher: IEEE
Published year: 2020
Published pages: 193-196
DOI identifier: 10.1109/ims30576.2020.9223856
ISBN: 978-1-7281-6815-9