W-Band LNA MMICs Based on a Noise-Optimized 50-nm Gate-Length Metamorphic HEMT Technology

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Fabian Thome, Arnulf Leuther, Felix Heinz, Oliver Ambacher

Journal title: 2019 IEEE MTT-S International Microwave Symposium (IMS)

Journal publisher: IEEE

Published year: 2019

Published pages: 168-171

DOI identifier: 10.1109/MWSYM.2019.8700792

ISBN: 978-1-7281-1309-8