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Authors: Fabian Thome, Arnulf Leuther, Juan Daniel Gallego, Frank Schafer, Michael Schlechtweg, Oliver Ambacher
Journal title: 2018 IEEE/MTT-S International Microwave Symposium - IMS
Journal publisher: IEEE
Published year: 2018
Published pages: 1495-1498
DOI identifier: 10.1109/MWSYM.2018.8439685
ISBN: 978-1-5386-5067-7