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Authors: Johan Bauwelinck; M. Verbeke; J. Lambrecht; M. Vanhoecke; L. Breyne; G. Coudyzer; J. Declercq; B. Moeneclaey; R. Ahmed; N. Singh; C. Bruynsteen; C. Wang; S. Niu; X. Wang; T. Pannier; Y. Gu; A. Vandierendonck; B. Van Lombergen; J. Van Kerrebroucku; H. Ramon; M. Verplaetse; G. Torfs; X. Yin; P. Ossie
Journal title: Proc. of SPIE
Journal number: 1
Journal publisher: SPIE Digital Library
Published year: 2022
DOI identifier: 10.1117/12.2607210
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