Towards a foundation for holistic power system validation and testing

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Authors: M. Blank, S. Lehnhoff, K. Heussen, D. E. Morales Bondy, C. Moyo, T. Strasser

Journal title: 2016 IEEE 21st International Conference on Emerging Technologies and Factory Automation (ETFA)

Journal publisher: IEEE

Published year: 2016

Published pages: 1-4

DOI identifier: 10.1109/ETFA.2016.7733672

ISBN: 978-1-5090-1314-2