Experimental analysis of variability in WS2-based devices for hardware security

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Authors: M. Vatalaro, H. Neill, F. Gity, P. Magnone, V. Maccaronio, C. Márquez, J.C. Galdon, F. Gamiz, F. Crupi, P. Hurley, R. De Rose

Journal title: Solid-State Electronics

Journal number: Volume 207, 2023, 108701

Journal publisher: Pergamon Press Ltd.

Published year: 2023

DOI identifier: 10.1016/j.sse.2023.108701

ISSN: 0038-1101