Automatic prediction of MOSFETs threshold voltage by machine learning algorithms

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Authors: S. Choi , J. Mitard (imec)

Journal title: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

Journal publisher: IEEE

Published year: 2023

Published pages: pp. 1-3

DOI identifier: 10.1109/edtm55494.2023.10103059

ISBN: 979-8-3503-3252-0