Development of a transmission line model for the thickness prediction of thin films via the infrared interference method

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Authors: C. Mpilitos, N. Kantartzis, S. Amanatiadis, G. Apostolidis, G. Karagiannis, T. Zygiridis

Journal title: 2018 7th International Conference on Modern Circuits and Systems Technologies (MOCAST)

Journal publisher: IEEE

Published year: 2018

Published pages: 1-4

DOI identifier: 10.1109/MOCAST.2018.8376575

ISBN: 978-1-5386-4788-2