MeV SIMS system with Reflectron TOF spectrometer and capillary ion beam micro-collimation avail-able for TA

Progress in particle detectors for IBA applications is driven by the need to separate close molecular masses by MeV SIMS and distinguish neighbouring elements in depthresolved analysis by RBS and ERD Small fragmentation high desorption efficiency and minimal sample pretreatment have recently made MeV SIMS very attractive to new users over a wide range of applications Its analytical capabilities will be further explored in particular taking advantage of the possibility of combining it with other IBA techniques Existing MeV SIMS systems will be upgraded to provide higher mass resolution Reflectron mass analyser geometry will be implemented at RBI