Examining Different Regimes of Ionization-Induced Damage in GaN Through Atomistic Simulations

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: M.C. Sequeira, F. Djurabekova, K. Nordlund, J.-G. Mattei, I. Monnet, C. Grygiel, E. Alves, K. Lorenz

Journal title: Small

Journal number: 18

Journal publisher: Wiley - V C H Verlag GmbbH & Co.

Published year: 2022

Published pages: 2102235

DOI identifier: 10.1002/smll.202102235

ISSN: 1613-6810