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Authors: Thibault Seure, Steffen Blum, Eric Wille, Marcos Bavdaz, Uwe Schaeffer, Nicolas Lièvre, Adeeb Nazeeruddin, Maximilien J. Collon, Nicolas M. Barrière, Vadim Burwitz, Michael Krumrey, Peter Müller, Levent Cibik, Dervis Vernani
Journal title: Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
Journal number: Proceedings Volume 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII; 103990F (2017)
Journal publisher: SPIE
Published year: 2017
Published pages: 14
DOI identifier: 10.1117/12.2273829
ISBN: 9781-510612563