Radiation hardness studies of AMS HV-CMOS 350 nm prototype chip HVStripV1

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Authors: K. Kanisauskas, A. Affolder, K. Arndt, R. Bates, M. Benoit, F. Di Bello, A. Blue, D. Bortoletto, M. Buckland, C. Buttar, P. Caragiulo, D. Das, J. Dopke, A. Dragone, F. Ehrler, V. Fadeyev, Z. Galloway, H. Grabas, I.M. Gregor, P. Grenier, A. Grillo, B. Hiti, M. Hoeferkamp, L.B.A. Hommels, B.T. Huffman, J. John, C. Kenney, J. Kramberger, Z. Liang, I. Mandic, D. Maneuski, F. Martinez-Mckinney, S. MacM

Journal title: Journal of Instrumentation

Journal number: 12/02

Journal publisher: Institute of Physics

Published year: 2017

Published pages: P02010-P02010

DOI identifier: 10.1088/1748-0221/12/02/P02010

ISSN: 1748-0221