Simulations of depleted CMOS sensors for high-radiation environments

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Authors: J. Liu, M. Barbero, S. Bhat, P. Breugnon, I. Caicedo, Z. Chen, Y. Degerli, S. Godiot-Basolo, F. Guilloux, T. Hemperek, T. Hirono, F. Hügging, H. Krüger, K. Moustakas, P. Pangaud, A. Rozanov, P. Rymaszewski, P. Schwemling, M. Wang, T. Wang, N. Wermes, L. Zhang

Journal title: Journal of Instrumentation

Journal number: 12/11

Journal publisher: Institute of Physics

Published year: 2017

Published pages: C11013-C11013

DOI identifier: 10.1088/1748-0221/12/11/c11013

ISSN: 1748-0221