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Authors: M. Antonova, R. Asfandiyarov, R. Bayes, P. Benoit, A. Blondel, M. Bogomilov, A. Bross, F. Cadoux, A. Cervera, N. Chikuma, A. Dudarev, T. Ekelof, Y. Favre, S. Fedotov, S-P. Hallsjo, A. K. Ichikawa, A. Izmaylov, Y. Karadzhov, M. Khabibullin, A. Khotyantsev, A. Kleymenova, T. Koga, A. Kostin, Y. Kudenko, V. Likhacheva, B. Martinez, R. Matev, M. Medvedeva, A. Mefodiev, A. Minamino, O. Mineev, G. Mitev
Journal title: 2017 XXVI International Scientific Conference Electronics (ET)
Journal publisher: IEEE
Published year: 2017
Published pages: 1-4
DOI identifier: 10.1109/ET.2017.8124369
ISBN: 978-1-5386-1753-3
- Not specified