Combined Bulk and Surface Radiation Damage Effects at Very High Fluences in Silicon Detectors: Measurements and TCAD Simulations

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Authors: F. Moscatelli, D. Passeri, A. Morozzi, Roberto Mendicino, G.-F. Dalla Betta, G. M. Bilei

Journal title: IEEE Transactions on Nuclear Science

Journal number: 63/5

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2016

Published pages: 2716-2723

DOI identifier: 10.1109/TNS.2016.2599560

ISSN: 0018-9499