Measurements and TCAD simulations of bulk and surface radiation damage effects in silicon detectors

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Authors: F. Moscatelli, P. Maccagnani, D. Passeri, G.M. Bilei, L. Servoli, A. Morozzi, G.-F. Dalla Betta, R. Mendicino, M. Boscardin, N. Zorzi

Journal title: 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

Journal publisher: IEEE

Published year: 2015

Published pages: 1-6

DOI identifier: 10.1109/NSSMIC.2015.7581944

ISBN: 978-1-4673-9862-6