Application of Synchrotron Radiation Based X-ray Reflectometry in Analysis of TiO 2 Nanolayers, Unmodified and Irradiated with Xe q+ Ions

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Authors: R. Stachura, A. Kubala-Kukuś, D. Banaś, I. Stabrawa, K. Szary, P. Jagodziński, G. Aquilanti, I. Božičević Mihalić, M. Pajek, J. Semaniak, M. Teodorczyk

Journal title: Acta Physica Polonica A

Journal number: 137/1

Journal publisher: Polska Akademia Nauk

Published year: 2020

Published pages: 38-43

DOI identifier: 10.12693/aphyspola.137.38

ISSN: 0587-4246