Reflectivity and photoelectron yield from copper in accelerators

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Authors: La Francesca, E.; Angelucci, M.; Liedl, A.; Spallino, L.; Gonzalez, L.A.; Bellafont, I.; Siewert, F.; Sertsu, M.G.; Sokolov, A.; Schäfers, F.; Cimino, R.

Journal title: Phys. Rev Accel. Beams

Journal number: 23

Journal publisher: American Physical Society

Published year: 2020

Published pages: 083101

DOI identifier: 10.1103/physrevaccelbeams.23.083101

ISSN: 2469-9888