Nanoscale imaging applications of soft X-ray microscope based on a gas-puff target source

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Authors: P. W. Wachulak, A. Torrisi, A. Bartnik, L. Wegrzynski, T. Fok, H. Fiedorowicz

Journal title: Journal of Physics: Conference Series

Journal number: 849

Journal publisher: Institute of Physics

Published year: 2017

Published pages: 012050

DOI identifier: 10.1088/1742-6596/849/1/012050

ISSN: 1742-6588