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Authors: Yanjun Shi, Jiajian Li , Lingling Lv (School of Mechanical Engineering, Dalian University of Technology, Dalian, China) and Qiaomei Han (School of Electrical and Computing Engineering, Western University, London, ON, Canada)
Journal title: IEEE Access
Journal number: Volume 8
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2020
DOI identifier: 10.1109/access.2020.3039263
ISSN: 2169-3536