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Authors: Jean Hoyos, Ali Bin Junaid, Muhammad Raheel Afzal, Asad Tirmizi, Patricia Leconte
Journal title: 2022 IEEE/SICE International Symposium on System Integration (SII)
Journal publisher: 2022 IEEE/SICE International Symposium on System Integration (SII)
Published year: 2022
DOI identifier: 10.1109/sii52469.2022.9708791
ISSN: 2474-2325
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