Standard Delay Cells with Improved Tolerance to Single Event Transients

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Authors: M. Andjelkovic, C. Calligaro, O. Schrape , U. Gatti, F.A. Kuentzer, M. Krstic

Journal title: IEEE International Conference on Microelectronics

Journal number: 32nd, 329 (2021)

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

DOI identifier: 10.1109/miel52794.2021.9569110