Automatic generation of digital-twins in advanced manufacturing: a feasibility study

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Authors: Francisco Ambrosio Garcia; Pavel Eremeev; Hendrik Devriendt; Frank Naets; Hüseyin Metin; Merih Özer

Journal title: 7th International Conference on Control, Automation and Diagnosis

Journal publisher: IEEE

Published year: 2023

DOI identifier: 10.1109/iccad57653.2023.10152364

ISBN: 979-8-3503-4707-4