Comparing the EKF with inverse black-box models in system identification of a chemical stirred tank

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Authors: Arash M. Zadeh Fard, Francisco Ambrosio Garcia, Matteo Kirchner, Bart Blockmans, Wim Desmet, Frank Naets

Journal title: 7th International Conference on Control, Automation and Diagnosis (ICCAD)

Journal publisher: IEEE

Published year: 2023

DOI identifier: 10.1109/iccad57653.2023.10152434

ISBN: 979-8-3503-4707-4