Summary
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Authors: R. Hersent, Tom K. Johansen, V. Nodjiadjim, F. Jorge, B. Duval, F. Blache1, M. Riet, C. Mismer1 and A. Konczykowska
Journal publisher: IEEE
Published year: 2021
DOI identifier: 10.1109/bcicts50416.2021.9682463