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Authors: Aref Rasoulzadeh Zali, Steven Kleijn, Luc Augustin, Netsanet M Tessema, Kristif Prifti, Ripalta Stabile, Nicola Calabretta
Journal title: JLT IEEE
Journal number: vol. 32, no. 6
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2022
Published pages: 1083-1091
DOI identifier: 10.1109/jlt.2021.3128426
ISSN: 2169-3536