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Authors: P. Coudrain, J.-P. Colonna, L.-M. Collin, R. Prieto, L.G. Frechette, J. Barrau, G. Savelli, P. Vivet, Q. Struss, J. Widiez, K. Vladimirova, K. Triantopoulos, H. Beckrich-Ros, M. Vilarrubi, G. Laguna, H. Azarkish, M. Shirazi, J. Michailos
Journal title: 2018 IEEE Symposium on VLSI Technology
Journal publisher: IEEE
Published year: 2018
Published pages: 15-16
DOI identifier: 10.1109/vlsit.2018.8510677
ISBN: 978-1-5386-4218-4